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Electronic Component Temperature Humidity Reliability Chamber Programmable RS485 Data Logger

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Electronic Component Temperature Humidity Reliability Chamber Programmable RS485 Data Logger

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Brand Name :	YUYANG
Model Number :	YYE009-100L
Certification :	CE
Price :	$2000
Payment Terms :	T/T, L/C, Western Union
Supply Ability :	200 sets per month
Delivery Time :	5-10 work days

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Electronic Component Temperature Humidity Reliability Chamber Programmable RS485 Data Logger

Electronic Component Temperature Humidity Reliability Chamber

Programmable RS485 Data Logger for comprehensive environmental testing of electronic components and materials.

Applications

This testing chamber evaluates material resistance to heat, cold, dry, and humid conditions. Ideal for testing products in electronics, electrical appliances, communications, instrumentation, vehicles, plastic products, metals, food, chemicals, building materials, aerospace, and various industrial applications.

Key Features

Precise and durable conditioning system with rapid response times
Wide humidity range: 5% to 98% R.H. ±0.5%
Broad temperature range: -20°C to 150°C ±0.5°C
Comprehensive resistance testing for heat, cold, dry, and humidity endurance
Suitable for conditioning various samples prior to testing
Ideal for quality control across multiple industries including electronics, electrical equipment, automotive, metals, food, chemicals, and building materials

Technical Specifications

Model	YYE009-100L
Inner Size (W×H×D)	500×400×500 mm
External Size (W×H×D)	1000×1000×1400 mm
Temperature Range	-20ºC to +70ºC
Humidity Range	10% to 85% R.H.
Temperature Analytic Accuracy/Uniformity	0.1ºC / ±2.0ºC
Temperature Fluctuation	±0.5ºC
Humidity Analytic Accuracy / Control Accuracy	±0.1% / ±3%
Heating Rate	3.0°C/min (average)
Cooling Rate	1.0°C/min (average)
Power Supply	AC220V 50/60Hz & 1
Weight	180 kg

Compliance Standards

GB/T2423.1-2008, GB/T2423.2-2008, GB/T2423.3-2006, GB/T2423.4-2008, GB10589-2008, GB11158-2008, GB10586-2006, GJB150.3-1986, GJB150.4-1986, GJB150.9-1986

Temperature humidity chamber interior view

Testing chamber side view and construction

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